| |
|
TestCraft
TestCraft´Â DFT(Design-For-Test) synthesis¸¦ À§ÇÑ ÅøÀ̸ç, RTLÀ̳ª
gate-levelÀ» ¹Þ¾Æµé¿© DFT checking, fixing, scan implementationÀ»
¼öÇàÇÕ´Ï´Ù. ¶ÇÇÑ ±âÁ¸ÀÇ ATPG(Automatic Test Pattern Generation)
ÅøÀ» À§ÇÑ interface±â´ÉÀ» °¡Áö°í ÀÖ½À´Ï´Ù. TestCraft´Â stand-aloneÀ¸·Î
»ç¿ëµÇ¾î Áú ¼öµµ ÀÖÀ¸¸ç, DesignCraft³ª DesignCraft Pro¿Í ÇÔ²² »ç¿ëµÇ¾î Áú
¼öµµ ÀÖ½À´Ï´Ù. TestCraftÀÇ flow´Â ´ÙÀ½°ú °°½À´Ï´Ù.
Features
Fast turn-around
SEDAN (STA Enhanced DFT Analysis) conceptÀ» »ç¿ëÇÏ¿© ±âÁ¸ÀÇ ´Ù¸¥
Åø¿¡ ºñÇØ 2x~5x Á¤µµ ¼Óµµ°¡ »¡¶ó Á³½À´Ï´Ù.
Advanced features
- Proprietary technologies for DFT analysis and fixing
(including memory, black box bypass, pad logic integration,
asynchronous and clock signals, bi-directional ports,
bus conflict, etc)
- Scan implementation 1.Scan cell
replacement
2.Scan chain breaking/stitching
3.Easy integration with IP's with
existing scan chains
- Comprehensive DFT report for final DFT results
Seamless integration
with ATPG methodologies
Unified timing engine
One pass logic, physical,
and test synthesis
Compatible methodology
for easy adoption
Easy to use Tcl-based
Shell and GUI
|

|
|